Advantest Corporation announced on April 20 the launch of the Pin Scale 5000B, a new digital card designed for its V93000 EXA Scale generation of SoC test platforms. The card is specifically engineered to address the rigorous testing requirements of next-generation Artificial Intelligence (AI) and High-Performance Computing (HPC) semiconductors.
As the industry shifts toward advanced process nodes and chiplet-based heterogeneous integration, the demand for broader test coverage and large-scale data processing has surged. Advantest developed the Pin Scale 5000B to meet these market needs, featuring significantly expanded vector memory capacity compared to previous models.
A key advantage of the Pin Scale 5000B is its ability to optimize memory usage within chiplet architectures. By streamlining data handling, the card helps customers reduce overall memory consumption and lower the total cost of test. Furthermore, the solution allows for incremental upgrades while maintaining existing test programs and hardware configurations, ensuring high investment efficiency for manufacturers.
The Pin Scale 5000B also introduces support for the latest scan fabric architectures. It utilizes a streaming data delivery method that enables parallel testing of multiple IP cores, a feature Advantest highlights as a major competitive differentiator in handling complex SoCs.
“As AI and HPC continue to push the boundaries of scale and density, semiconductor testing solutions must evolve in tandem,” an Advantest official stated. “The enhanced performance of the Pin Scale 5000B will significantly extend the testing capabilities of the V93000 EXA Scale platform, providing the power and flexibility our customers need for the future of silicon.”
